Method for the fabrication of electron field emission devices including carbon nanotube electron field emission devices

ABSTRACT

The present invention is directed to a method for the fabrication of electron field emitter devices, including carbon nanotube (CNT) field emission devices. The method of the present invention involves depositing one or more electrically conductive thin-film layers onto a electrically conductive substrate and performing lithography and etching on these thin film layers to pattern them into the desired shapes. The top-most layer may be of a material type that acts as a catalyst for the growth of single- or multiple-walled carbon nanotubes (CNTs). Subsequently, the substrate is etched to form a high-aspect ratio post or pillar structure onto which the previously patterned thin film layers are positioned. Carbon nanotubes may be grown on the catalyst material layer. The present invention also described methods by which the individual field emission devices may be singulated into individual die from a substrate.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation of U.S. application Ser. No.13/113,378, filed May 23, 2011, now allowed, the entire contents ofwhich is hereby incorporated by reference.

FIELD OF INVENTION

The present invention is directed to a method for the fabrication ofelectron field emitter devices, including carbon nanotube (CNT) fieldemission devices. These devices have application in any product orsystem employing electron beams or sources, including: electron-beamimaging; electron-beam lithography; field electron spectroscopy;electron-gun sources; atomically shaped emitter tips; electron-beamsensing; etc. These devices can be implemented as single field emitterdevices or as arrays of field emitter devices, even very large arrays offield emitter devices. The present invention is applicable to theimplementation of any electron-beam field emitter structure, with orwithout the employment of carbon nanotubes as the field emitter ofelectrons. The present invention allows large field emitter arrays to beimplemented for faster through-put electron-beam imaging andelectron-beam lithography.

BACKGROUND OF THE INVENTION

Electron field emission is an emission of electrons induced by externalelectromagnetic fields. Field emission can happen from solid and liquidsurfaces, or individual atoms into vacuum or open air, or result inpromotion of electrons from the valence to conduction band ofsemiconductors.

Field emission in pure metals occurs in high electric fields: thegradients are typically higher than 1000 volts per micron and stronglydependent upon the work function of the metal. Electron sources based onfield emission have a number of applications, including electron sourcesfor high-resolution electron microscopes and electron-beam lithography.Field emission is explained by quantum tunneling using theFowler-Nordheim equations.

Although electron field emitters have been known for some time and thereare a number of methods that have been employed to implement theseemitters, most emitters have an aspect ratio, that is aheight-to-diameter ratio, that is very limited. It is often desired thatthe emitter have an atomically-sharp-shaped end, be composed of highlyconductive materials, and have a height from the substrate surface of asignificant amount. Consequently, structures meeting these requirementsare difficult to implement.

More recently, enormous interest has been shown in using carbonnanotubes, either single-walled or multi-walled carbon nanotubes, asfield emitters due to the excellent material properties of carbonnanotubes. In general, carbon nanotubes have a limited height that theycan be grown and this height is not sufficient to reduce the electricalfield effects from the substrate floor. Therefore, it is desired thatthe carbon nanotube be implemented onto a highly-conductive materialformed into high-aspect ratio structure. These structures are alsodifficult to implement.

SUMMARY OF INVENTION

The present invention is directed to a method for the fabrication ofelectron field emitter devices, including carbon nanotube (CNT) fieldemitter devices. These devices have application in any product or systememploying electron beams or sources, including: electron-beam imaging;electron-beam lithography; field electron spectroscopy; electron-gunsources; atomically sharp emitter tips; electron-beam sensing; etc.These devices can be implemented as single emitters or as arrays, evenvery large arrays of emitters. The present invention is applicable tothe implementation of any electron-beam field emitter structure, with orwithout the employment of carbon nanotubes as the emitter of electrons.The present invention allows large field emitter arrays to beimplemented for faster through-put electron-beam imaging andelectron-beam lithography.

The present invention employs the techniques of Micro-Electro-MechanicalSystems (MEMS), Nano-Electro-Mechanical Systems (NEMS), and micro- andnano-fabrication for the implementation of electron field emitterdevices. In addition, the present invention is applicable as a method ofimplementation for any type of emission device.

The present invention is a method of cost effectively fabricatinghigh-performance field emission devices for a variety of usefulapplications.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is an illustration of a field emission device with a carbonnanotube emitter according to the invention.

FIG. 2 is an illustration of an array of field emission devices withcarbon nanotube emitters according to the invention.

FIG. 3 is an illustration of a field emission device without carbonnanotubes according to the invention.

FIG. 4 is a cross-sectional view illustrating a fabrication sequence ofa field emission device according to the invention.

FIG. 5 is a cross-sectional illustration of a first preferred method forthe separation of the field emission device substrate.

FIG. 6 is a cross-sectional illustration of a second preferred methodfor the separation of the field emission device substrate.

FIG. 7 is a cross-sectional illustration of a third preferred method forthe separation of the field emission device substrate.

DETAILED DESCRIPTION OF THE INVENTION

The present invention is directed to a method for the fabrication ofcarbon nanotube (CNT) electron field emitter devices. These devices haveapplication in any product or system using electron beams including:electron-beam imaging; electron-beam lithography; field electronspectroscopy; electron-gun sources; atomically sharp emitter tips;electron-beam sensing; and many more. These devices can be implementedas single field emitters or as arrays of field emitters, even very largearrays of field emitters, including but not limited to arrays of tens,hundreds, thousands, millions, or tens of millions of emitters, or more.The present invention is applicable to the implementation of anyelectron-beam field emitter structure, with or without the employment ofcarbon nanotubes as an emitter of electrons. The present inventionallows large field emitter arrays to be implemented for fast throughputelectron-beam imaging, electron-beam lithography that have applicationin semiconductor fabrication, as well as many other importantapplications.

Electron field emission is an emission of electrons induced by externalelectromagnetic fields. Field emission can happen from solid and liquidsurfaces, or individual atoms into vacuum or open air, or result inpromotion of electrons from the valence to conduction band ofsemiconductors.

Field emission in pure metals occurs in high electric fields: thegradients are typically higher than 1000 volts per micron and stronglydependent upon the work function of the metal. Electron sources based onfield emission have a number of applications, including electron sourcesfor high-resolution electron microscopes and electron-beam lithography.Field emission can be analytically modeled by quantum tunneling usingthe Fowler-Nordheim equations.

Although electron field emitters have been known for some time, andthere are a number of methods that have been employed to implement theseemitters, most emitters have a limited height-to-diameter aspect ratio.Also, most field emitters at the micro- and nano-scale have limited tipheights (i.e., distance from the surfaces where the electrons areemitted from to the surrounding substrate). It is often desired that theemitter have an atomically-sharp tip, be composed of highly conductivematerials, have a height from the substrate surface of a significantamount, and a large height compared to the diameter over all or someportion of the device (i.e., large aspect ratio). Consequently, thesestructures meeting these requirements are difficult to implement.

More recently, enormous interest has been shown in using carbonnanotubes, either single-walled or multi-walled carbon nanotubes, asfield emitters due to the excellent material and electrical propertiesof carbon nanotubes. In general, carbon nanotubes have a limited heightthat they can be grown, and this height is not sufficient to reduce thefield effects from the substrate floor. Therefore, it is desired thatthe carbon nanotube be implemented on a highly-electrically conductivematerial formed into a structure having the desirable emitter structuralproperties discussed above as well as certain specific materialproperties conducive to carbon nanotube growth and device operation.These structures are also difficult to implement.

The present invention is directed at a method for the fabrication ofelectron field emission devices including, but not limited to carbonnanotube electron emission devices in a cost effective and efficientmanner using the techniques of Micro-Electro-Mechanical Systems (MEMS),Nano-Electro-Mechanical Systems (NEMS), and micro- and nano-fabricationfor the implementation. A key element of the method of the presentinvention is the plasma etch technology used to implement thehigh-aspect ratio pillar or post structures having sloping sidewalls.

FIG. 1 is a drawing of a single field emitter device 10 of the presentinvention. FIG. 2 is an array of field emitters to form a device 20which is illustrated as a plurality of these devices arranged across thesubstrate in any desired number, density, and pattern as desired for agiven application. As shown in FIGS. 1 and 2 the field emitter devices10 and 20 are made on a substrate 16 and has pillar or post (hereafterthe terms “pillar” and “post” will be used interchangeably) structures15 that are preferably made of an electrically conductive firstmaterial. It is preferable that this material be micro- or nano-machinedusing appropriate fabrication techniques. There are several materialchoices for the pillar structure 15, including, but not limited tosilicon, and more preferably, highly electrically conductive silicon.The substrate and the pillar may or may not be made of the samematerial, depending on the design and application in which the fieldemitter device 10 or 20 may be used. Alternatively, other semiconductorsor metals may be used for this structure. This pillar structure 15 mayhave a shape wherein the diameter of the top 19 of the pillar structure15 is equal to or less than the diameter of the pillar structure 15 atthe base 13, as shown in FIGS. 1 and 2. This shape may be preferredsince it provides increased mechanical stability and better electricalperformance due to the ability to concentrate the electrical field atthe emitter tip.

The top 19 of the post structure 15 is preferably extremely flat, smoothand uniform and preferably uses the top surface of a silicon virginsubstrate 14, wherein the surface qualities of semiconductor-gradesilicon wafers are excellent for this application. The pillar structure15 can be formed by etching or by other means of micro- ornano-machining.

On the top surface 14 of the pillar structure 15 can be located a secondmaterial 12 that is conductive to electrons. Preferably, material 12 ishighly conductive to electrons. The thickness of this layer 12 can beless than 10 nanometers, between 10 and 100 nanometers, or more than 100nanometers depending on the properties desired of the emitter, the typeof material layer 12 used, and the processing complexity andcompatibility issues involved in the fabrication of the device 10 or 20.This layer 12 may also serve as a diffusion barrier to carbon nanotubecatalyst materials during their growth if the field emitter employscarbon nanotube(s) 18 at the tip(s) of the field emission devices 10 and20. Preferably, the material layer 12 has a surface that is smooth.Preferably, this material layer 12 can be chosen from a number ofmaterial types meeting the above-mentioned criteria, including but notlimited to a layer of Titanium-Nitride (TiN). The diameter of thematerial layer 12 can be varied, depending on the emitter device 10 and20 properties, and preferably is between 300 and 500 nanometers,although dimensions below and above this range may be acceptable, oreven desirable for certain applications. The thickness of the materiallayer 12 made of TiN can be varied, depending on the field emitterdevice 10 and 20 properties, and preferably is approximately 50nanometers thick, although thickness less than or greater than thisamount may be acceptable or even desirable for certain applications.

On the top surface of this material layer 12, which is located on thetop surface 14 of the pillar structure 15, may be located a thirdmaterial layer 11 that is conductive to electrons. Material layer 11 maybe a catalyst for CNT growth as mentioned below, whereas material layer12 is not. The thickness of this layer 11 can be less than 5 nanometers,between 5 and 10 nanometers, or more than 10 nanometers depending on theproperties desired of the field emitter device 10 and 20. Preferably,this third material layer 11 is composed of a 5 to 12 nanometer thicklayer of nickel (Ni), although other materials and thickness may beused, depending on the specifics of the field emitter device 10 and 20design. The diameter of this third material layer 11 can be varied,depending on the emitter properties, and preferably is between 100 and150 nanometers, although other dimensions may be suitable, depending onthe specifics of the field emitter device 10 and 20 design. This thirdmaterial layer 11 may also act as a catalyst material for the growth ofcarbon nanotubes subsequent to the field emitted device structurefabrication. Depending on the diameter and thickness of the thirdmaterial layer 11 acting as a catalyst, single or multi-walled carbonnanotubes may be grown.

The pillar structures 15 onto which layers 12 and 11 are fabricated canbe etched using a process for micromachining of the first layer materialsubstrate 16, including but not limited to deep silicon etching, if thefirst material substrate 16 is silicon, and to a depth of 10 microns orless, or preferably to a depth between 10 and 30 microns, and morepreferably to a depth of 30 microns or more, depending on the fieldemitter device 10 and 20 properties desired. The depth is measured fromthe top surface of the emitter structure without the nanotube(s), thatis, either the top of layer 12 or 11 to the floor of the substratesurface 17 surrounding the pillar or posts structure(s) 15. It isdesirable that the substrate surface 17 maintain a smooth surface afteretching.

It is preferable that the sidewalls of the pillar or post structure 15are smooth, with no sharp edges or features that protrude outwardly soas to concentrate the electrical field at the emitter tip. It is alsomay be more preferable that the top 14 of the pillar structures 15 haveno sharp corners.

After completion of the pillar structure 15 with one or more patternedlayers 12 and 11 on the top surface, carbon nanotubes 18 may be grown onthe surface of the third material layer 11, as shown in FIGS. 1 and 2.The carbon nanotubes 18 may be single-walled or multi-walled carbonnanotubes 18 depending on the desired properties of the field emissiondevice 10 or 20. The carbon nanotubes can be grown using means ofChemical Vapor Deposition (CVD).

Alternatively, as shown in FIG. 3, the field emission device 10, mayalso be implemented, whereby the carbon nanotubes 18 are not present,which may be desirable for certain applications. The device may also beimplemented in arrays of field emitters without carbon nanotube fieldemission tips.

The preferred method for fabrication of the field emission device 10 or20, also know as the process sequence for the device 10 or 20, isillustrated in FIG. 4. This process sequence has several preferredvariations and begins with a highly electrically conductive substratemade of a first material 16, as shown in FIG. 4 (a). In one embodiment,this first material substrate 16 is composed of highly-doped silicon.Importantly, the substrate may be made of other semiconductor materialsor metal, depending on the device requirements and application.

Depending on the thickness, type of material, and lithography techniqueused, the ability to align subsequent layers to one another usingalignment marks made in a second material layer can be difficult. Forexample, it can be difficult to align subsequent layers to alignmentmarks in the second material layer 12, depending on the low value ofthickness of the second material layer 12 combined with the electricalconductively of the patterned second material layer 12 on the surface ofa conductive substrate material 16, such as highly-doped silicon, whenusing e-beam lithography. This issue may be overcome by using a thickersecond material layer 12 or by etching through the second material layer12 and continuing the etching some depth into the surface 17 of thefirst substrate material 16.

An alternative embodiment of the process may be used to overcome thisproblem, as shown in FIG. 4 (a 1). Specifically, a layer of photoresistmay be deposited on the surface 14 of the first substrate material 16prior to the deposition of the second material layer 12. Then, usingappropriately high-resolution lithography, the photoresist is exposed todefine a pattern of alignment marks 24. Subsequently, the exposedsurface 14 of the first material substrate 16 can be etched to implementalignment marks 24 directly into the surface 14 of the first materialsubstrate 16, as shown in FIG. 4 (a 1). The formation of these alignmentmarks 24 in the surface 14 of the first substrate material 16 may bedone before the second material layer 12 has been deposited, asillustrated in FIG. 4 (a 1), or thereafter.

The etching into the surface 14 of the first material substrate 16 tomake the alignment marks 24 as shown in FIG. 4 (a 1) can be performedusing Reactive Ion Etching (RIE), Deep Reactive Ion Etching (DRIE), wetchemical etching, as well as any etching technique appropriate for thetype of material used in the first material substrate 16. DRIE ispreferred in the use of silicon as the first material substrate 16,since the amount of undercut of the mask will be minimized with the useof DRIE. The depth of the etch into the surface 14 of the firstsubstrate material 16 must be adequate to provide sufficient contrastfor the lithography tool to image the alignment marks 24 and therebyaccurately register the subsequently lithography steps to one another.This depth of the etch to form the alignment larks 24 will depend on thelithography technology used, as well as the lithography tool, but apreferred depth can be less than 0.5 micron, or between 0.5 to 1.0micron, or more than 1.0 micron.

Yet another alternative method of creating alignment marks, asillustrated in FIG. 4 (a 2), is to deposit a fourth material layer 23 onthe surface 14 of the first material substrate 16 and subsequentlyperform lithography and etching to pattern appropriate alignment marksin this fourth material layer 23 on the surface 14 of the first materialsubstrate 16 before the second material layer 12 has been deposited, asshown in FIG. 4 (a 2). The thickness of this fourth material layer 23forming the alignment marks 23 depends on obtaining sufficient contrastbetween this material layer 23 and the highly-doped first substratematerial 16 in the lithography tools, and could be selected from a largenumber of thin film material layer types, including, but not limited to:dielectrics (e.g., oxides, nitrides, oxy-nitrides, etc.); metals (e.g.,aluminum, platinum, etc.); polymers (e.g., photoresist, polyimide,etc.); etc.

A thin-film second material layer 12 that is highly electricallyconductive may be deposited on the surface 14 of the first materialsubstrate 16 as shown in FIG. 4 (b). As discussed above, the depositionof highly electrically conductive material layer 12 may be done onsubstrate 16 either with alignment marks 24 or 23 illustrated in FIGS. 4(a 1) and 4 (a 2), respectively, or with no alignment marks on substrate16, as shown in FIG. 4 (b), if the alignment can be performed withoutalignment marks, as also discussed above. If a carbon nanotube fieldemission device 10 or 20 (FIG. 1 or 2) is being implemented, it may bepreferable that the second material layer 12 also acts as a diffusionbarrier for the carbon nanotube catalyst material 11 that will bedeposited later. A number of different material types can be used forthis second material layer 12, including but not limited to a layer ofTitanium-Nitride (TiN) on the surface 14 of the first substrate material16. The important material and electrical properties of the secondmaterial layer 12 include: good electrical conductivity; good adhesionto the underlying substrate material 16; and an ability to be patternedand etched in the appropriately-sized dimensions for the field emissiondevice 10 and 20. If carbon nanotubes 18 are desired (FIG. 1 or 2) onthe field emission devices 10 and 20, the second material layer 12should also be an excellent barrier to the diffusion of the thirdmaterial layer 11 into the substrate material 16. It is also preferablethat surface of the second material layer 12 have a smooth surface, andmore preferable is the surface of the second material layer 12 isatomically smooth. The second material layer 12 should also becompatible with the other materials used in the device 10 and 20 and thefabrication processing steps used in implementation of the device 10 and20.

The thickness of this second material layer 12 can be less than 50nanometers, between 50 and 100 nanometers, or more than 100 nanometers,depending on the properties desired of the emitter device 10 and 20. Thediameter of the material layer 12 can be varied, depending on theemitter device 10 properties and preferably is between 300 and 500nanometers, although dimensions below and above this amount may beacceptable or even desirable for certain applications. The thickness ofthe material layer 12 made of TiN can be varied, depending on theemitter device 10 and 20 properties, and preferably is approximately 50nanometer thick.

The deposition for the second material layer 12 can be done usingChemical-Vapor Deposition (CVD) or Physical-Vapor Deposition (PVD)processes, including reactive PVD processes, or Atomic Layer Deposition(ALD). One example of a preferred method of depositing the secondmaterial layer 12 includes a reactive sputtering deposition process. Ifthe second material layer 12 is composed of TiN, the source material canbe sputtered from a titanium target and the titanium reacts with thebackground nitrogen (N2) gas during deposition to form Titanium-Nitride(TiN). The preferred sputtering process parameters are: 3 milli-Torrpressure of Ar/N2 at 50 standard cubic centimeters per minute operatingat a target sputtering power of 2000 Watts and a 350 kHz asymmetricpulsed-DC frequency with a 1.1 microsecond reverse phase duration. It isdesired that the percentage of Titanium to Nitrogen in the deposited TiNfilm layer be approximately 50% to 50%, respectively. However, othersputtering and evaporation processes may be used and provide equallydesirable results for deposition of the second material layer 12.

Another example of a preferred embodiment for deposition of the secondmaterial layer 12 includes a reactive evaporation deposition process,whereby the source material is evaporated from a titanium target and thetitanium reacts with the background nitrogen gas during the depositionand on the surface of the substrate. The preferred evaporation processparameters are: 0.75 milli-Torr N2 background gas with evaporation froma titanium source material and ion-assisted deposition from an ionsource using Argon (Ar) and N2 to modify the TiN film in situ. Yetanother example of a preferred embodiment for the deposition of thesecond material layer 12 includes a sputtering deposition process,whereby the source material is sputtered from a Titanium-Nitride targetand the Titanium-Nitride deposits on the surface of the substrate. Thepreferred sputtering process parameters are: 5 milli-Torr Ar/N2 at 50standard centimeters per minute of Ar, and 10 standard centimeters perminute N2 at a target sputtering power of 2000 Watts and a 350 kHzasymmetric pulsed-DC frequency with a 1.1 microsecond reverse phaseduration.

Once the second material layer 12 has been deposited, it may bedesirable to anneal this layer. This can be done using an anneal furnaceor a rapid-thermal anneal (RTA) process, or other means, as appropriate.The anneal may be performed with a background non-reactive gas such asNitrogen or Argon and at a temperature of approximately 800° C. for 30seconds, if the second material layer 12 is composed of a TiN thin film.Other annealing temperatures may be desirable if the second materiallayer 12 is composed of a different material type or composition.

It may be desirable to anneal the second material layer 12 soon orimmediately after the deposition of this layer. This may be desirable toavoid contamination or oxidation of this second material layer 12.Alternatively, it may be desirable to perform the anneal within the samechamber that the second material layer 12 was deposited, that is in-situanneal, and thereby avoid exposing the second material layer 12 to theambient environment until after the anneal has been completed.

Subsequently, a third material layer 11 will be deposited on the secondmaterial layer 12, as shown in FIG. 4 (c 1). The third material layer 11will preferably be electrically conductive. Additionally, it may bepreferable that this third layer material 11 is also a catalyst for thegrowth of carbon nanotubes 18. Many material types can be chosen forthis third layer material 11, including but not limited to Nickel,Cobalt, Molybdenum, Iron, or their combinations. The choice of catalystdepends on many factors, including but not limited to, surroundingmaterials, process temperature/conditions, and desired nanotubeproperties. For example, nickel works when it is within an electricallyconductive path; whereas, Iron works best if it is electricallyinsulated. Exact nature of the CNT growth is not well understood yet. Coalone tends to produce multi-walled CNTs, but when combined with Mo,Co—Mo composite is very effective for single-walled CNT growth. However,Mo alone doesn't work at typical low-temp (700 C) growths, but has ahigh efficiency single-walled growth at high-temperatures (1200 C).Preferably the third material layer 11 will have a thickness that can beless than 5 nanometers, between 5 and 10 nanometers, or more than 10nanometers, depending on the properties desired of the emitter device 10and 20.

The third material layer 11 may be deposited using a number of commonlyused deposition technologies including: evaporation, sputtering, atomiclayer deposition, etc.

After deposition of the third material layer 11, lithography isperformed to pattern and etch this third material layer 11 into thefirst predefined shapes and dimensions. The dimensional resolution ofthe lithography must be able to create sub-micron features withsub-micron registration accuracy for each layer. The lithography can beperformed by several means, including e-beam direct write lithography,interference lithography, and Deep Ultra-Violet (Deep UV or DUV) opticallithography.

The third material layer 11 is then etched, as shown in FIG. 4 (d),using appropriate means of etching that can include, but is not limitedto: Reactive Ion Etching (RIE), ion milling, as well as wet chemicaletching means, as shown in FIG. 4 (d). It is preferable that the etchtechnology used, etch the third material layer 11 at a rate greater thanthe underlying second material layer 12. It is also preferable that theetch process used on the third layer 11 be as uniform across thesubstrate as possible.

If ion milling is used to pattern the third material layer 11, materialmay re-deposit around the perimeter of the masked features. This canmake the removal of the masking photoresist layer very difficult. It canmodify the dimensions of the features being patterned in the thirdmaterial layer 11, and it can leave behind unwanted material on thefeatures. This is a common and undesirable attribute of ion milling, butcan be readily resolved by performing a short in time duration ionmilling at an oblique angle after the third material layer has beencompletely removed from the undesired areas. Re-deposition caused by ionmilling can also be removed by ion milling at an oblique angle forperiods of short times periodically during the ion milling from a morevertical or normal angle to the substrate.

The diameter of the third material layer 11 can be varied, depending onthe emitter device 10 and 20 properties, and preferably is between 100and 150 nanometers, although dimensions below and above this range maybe acceptable or even desirable for certain applications. The thicknessof the material layer 11 made of Nickel can be varied, depending on theemitter device 10 and 20 properties, and preferably is approximately 7to 10 nanometers thick, although lesser or greater thicknesses may bedesirable, depending on the material combination used and the fieldemitter properties desired.

If reactive ion etching or ion milling is used to pattern the thirdmaterial layer 11, the photoresist mask may become hardened due to theexposure to the plasma or ions that are involved in this process, andthereby, the photoresist may become difficult to subsequently remove.Care must be taken in the resist removal process, given the thickness ofthe third material layer 11, to prevent removal, damage, degradation orcontamination of the third material layer 11. This is important, giventhe extreme thinness of the third material layer 11.

Depending on the type of material used for this layer, it may bedesirable to perform an oxygen plasma exposure for a short duration oftime to remove the hardened crust of photoresist. Subsequently, theremainder of the resist can be removed by other means, including but notlimited to, a solvent wet immersion strip. It may be important to notremove the entirety of the resist with an oxygen plasma, since exposureof the third material layer 11 to the plasma may oxidize, damage, orremove this layer.

A second preferred method of patterning the third material layer 11 usesa technique known as “lift-off”, which is an additive method for layerpatterning, as opposed to subtractive methods of patterning, such asetching. Using “lift-off,” lithography is performed on the surface ofthe second material layer 12 of the substrate 16 using the inversepattern of the third material layer 11. After exposure and development,as well as a possible cleaning to remove any residual polymers left inthe openings, the third material layer 11 is deposited. Subsequently,the photoresist is lifted-off, thereby removing the unwanted materialthat is deposited on the resist and leaving behind the patterned thirdmaterial layer 11 where it was deposited directly onto the underlyingsubstrate surface (i.e., in places where the resist was absent) as shownin FIG. 4(d).

Lithography is performed to pattern and then etch the second materiallayer 12 to form layer 12 into the second predefined shapes anddimensions, as illustrated in FIG. 4 (e). The lithography is used todefine the second material layer 12 into shapes of the second materiallayer 12 at the top of the emitter devices. These shapes are preferablycircular, although other shapes may be possible or even desirable.Importantly, the dimensional resolution of the lithography must be ableto create sub-micron features with sub-micron registration accuracy foreach layer. The lithography can be performed by several means including,but not limited to, e-beam direct write lithography, interferencelithography, or Deep Ultra-Violet (Deep UV or DUV) optical lithography.

The etching of the second material layer 12 can be performed usingReactive Ion Etching (RIE) or Deep Reactive Ion Etching (DRIE), ionmilling, as well as wet chemical etching means resulting in a patternedand etched second material layer 12, as shown in FIG. 4 (e). It ispreferable that the etch technology used, etch the second material layer12 at a rate equal to or faster than the underlying first materialsubstrate 16. It is also preferable that the etch process used be asuniform across the first material substrate 16 as possible.

If ion milling is used to pattern the second material layer 12, materialmay re-deposit around the perimeter of the masked features. This canmake the removal of the masking photoresist layer very difficult. It canalso modify the dimensions of the features being patterned in the secondmaterial layer 12, and it can leave behind unwanted material on thefeatures. This is a common and undesirable attribute of ion milling, butcan be readily resolved by performing a short duration of time using ionmilling at an oblique angle after the third material layer has beencompletely removed from the undesired areas. Re-deposition caused by ionmilling can also be removed by ion milling at an oblique angle forperiods of short times periodically during the ion milling from a morevertical or normal angle to the substrate.

The diameter of the third material layer 12 can be varied, depending onthe emitter device 10 or 20 properties, and preferably is between 300and 500 nanometers, although dimensions below and above this range maybe acceptable or even desirable for certain applications.

If reactive ion etching or ion milling is used to pattern the secondmaterial layer 12, the photoresist mask may become hardened due to theexposure to the plasma or ions that are involved in this process, andthereby, the photoresist may become difficult to subsequently remove.Care must be taken in the resist removal process, given the thickness ofthe third material layer 11 to prevent removal, damage, degradation orcontamination of the third material layer 11. This is important, giventhe extreme thinness of the third material layer 11.

Depending on the type of material used for layer 11, it may be desirableto perform an oxygen plasma exposure for a short duration of time toremove the hardened crust of photoresist. Subsequently, the remainder ofthe resist can be removed by other means, including but not limited to asolvent wet immersion strip. It may be important to not remove theentirety of the resist with an oxygen plasma, since exposure of thethird material layer 11 to the plasma may oxidize, damage, or removethis layer.

The reason the third material layer 11 may be deposited before thesecond material layer 12 has been patterned and etched is that it may bedifficult to perform accurate lithography on the third material layer 11on the topology of the patterned and etched second material layer 12.

However, depending on the thicknesses, materials, and processingtechniques used, it may be preferable to alternatively pattern and etchthe second material layer 12, as shown in FIG. 4 (b 1), prior to thethird material layer 11 being deposited, as shown in FIG. 4 (c 2). Inthis alternative process sequence, lithography is performed to patternand etch the second material layer 12 after this layer 12 has beendeposited, and possibly annealed, as shown in FIGS. 4 (b 1) and 4 (b 2).The lithography is used to define the second material layer 12 into thesecond predefined shapes and dimensions of the second material layer 12at the top of the emitter devices 10 and 20. These shapes are preferablycircular, although other shapes may be possible or even desirable.Importantly, the dimensional resolution of the lithography must be ableto create sub-micron features with sub-micron registration accuracy foreach layer. The lithography can be performed by several means,including, but not limited to, e-beam direct write lithography,interference lithography, or Deep Ultra-Violet (Deep UV or DUV) opticallithography.

Simultaneously, during this lithography and etch process to pattern thesecond material layer 12, alignment marks 25 may be patterned in thelayer 12 so that subsequent layers can be accurately aligned (i.e.,registered) to one another, as shown in FIG. 4 (b 2).

The etching of the second material layer 12 on the first materialsubstrate 16 can be performed using Reactive Ion Etching (RIE) or DeepReactive Ion Etching (DRIE), ion milling, as well as wet chemicaletching means resulting in a patterned and etched second material layer12, as shown in FIGS. 4 (b 1) and 4 (b 2). It is preferable that theetch technology used, etch the second material layer 12 at a rate equalto or faster than the underlying first material substrate 16. It is alsopreferable that the etch process used be as uniform across the firstmaterial substrate 16 as possible.

If ion milling is used to pattern the second material layer 12, materialmay re-deposit around the perimeter of the masked features. This canmake the removal of the masking photoresist layer very difficult. It canmodify the dimensions of the features being patterned in the secondmaterial layer 12, and it can leave behind unwanted material on thefeatures. This is a common and undesirable attribute of ion milling, butcan be readily resolved by performing a short in time duration ionmilling at an oblique angle after the third material layer has beencompletely removed from the undesired areas. Re-deposition caused by ionmilling can also be removed by ion milling at an oblique angle forperiods of short times periodically during the ion milling from a morevertical or normal angle to the substrate.

Subsequently, in this alternative embodiment, a third material layer 11is deposited on the patterned and etched second material layer 12. Asbefore, the third material layer 11 will preferably be electricallyconductive. Additionally, it may be preferable that this third layermaterial 11 is also a catalyst for the growth of carbon nanotubes 18.Many material types can be chosen for this third layer material 11,including but not limited to Nickel or Iron. The criteria used forselecting third layer material 11 are discussed above. Preferably thethird material layer 11 will have a thickness that can be less than 5nanometers, between 5 and 10 nanometers, or more than 10 nanometers,depending on the properties desired of the emitter device 10, theproperties of the type of third material layer 11 selected, and theprocessing complexity and fabrication compatibility issues involved.

The third material layer 11 may be deposited in this alternativeembodiment using a number of commonly used deposition technologies,including, but not limited to: evaporation, sputtering, atomic layerdeposition, etc.

After deposition of the third material layer 11, as shown in FIG. 4 (c2), lithography is performed to pattern and etch this third materiallayer 11 into the first predefined shapes and dimensions, as shown inFIG. 4 (e). The dimensional resolution of the lithography must be ableto create sub-micron features with sub-micron registration accuracy foreach layer. The lithography can be performed by several means including,but not limited to e-beam direct write lithography, interferencelithography, or Deep Ultra-Violet (Deep UV or DUV) optical lithography.

The third material layer 11 is then etched using appropriate means ofetching that can include, but is not limited to: Reactive Ion Etching(RIE), ion milling, as well as wet chemical etching means, as shown inFIG. 4 (e). It is preferable that the etch technology used etch thethird material layer 11 at a rate equal to or faster than the underlyingsecond material layer 12. It is also preferable that the etch processused on the third layer 11 be as uniform across the substrate aspossible.

If ion milling is used to pattern the third material layer 11, materialmay re-deposit around the perimeter of the masked features. This canmake the removal of the masking photoresist layer very difficult. It canalso modify the dimensions of the features being patterned in the thirdmaterial layer 11, and it can leave behind unwanted material on thefeatures. This is a common and undesirable attribute of ion milling, butcan be readily resolved by performing a short in time duration ionmilling at an oblique angle after the third material layer has beencompletely removed from the undesired areas. Re-deposition caused by ionmilling can also be removed by ion milling at an oblique angle forperiods of short times periodically during the ion milling from a morevertical or normal angle to the substrate.

The diameter of the third material layer 11 can be varied depending onthe emitter device 10 and 20 properties and preferably is between 100and 150 nanometers, although dimensions below and above this range maybe acceptable or even desirable for certain applications. The thicknessof the material layer 11 made of Nickel can be varied depending on theemitter device 10 or 20 properties, and preferably is approximately 7 to10 nanometers thick, although lesser or greater thicknesses may bedesirable, depending on the material combination used and the fieldemitter properties desired.

If reactive ion etching or ion milling is used to pattern the thirdmaterial layer 11, the photoresist mask may become hardened due to theexposure to the plasma or ions that are involved in these process, andthereby, the photoresist may become difficult to subsequently remove.Care must be taken in the resist removal process given the thickness ofthe third material layer 11 to prevent removal, damage, degradation orcontamination of the third material layer 11. This is important giventhe extreme thinness of the third material layer 11.

Depending on the type of material used for this layer, it may bedesirable to perform an oxygen plasma exposure for a short duration oftime to remove the hardened crust of photoresist. Subsequently, theremainder of the resist can be removed by other means, including but notlimited to a solvent wet immersion strip. It may be important to notremove the entirety of the resist with an oxygen plasma, since exposureof the third material layer 11 to the plasma may oxidize, damage, orremove this layer.

An alternative and sometimes preferred method of patterning the thirdmaterial layer 11 in this alternative process sequence uses a techniqueknown as “lift-off” which is an additive method for layer patterning, asopposed to subtractive methods of patterning such as etching. Using“lift-off”, lithography is performed on the surface of the secondmaterial layer 12 of the substrate 16 using the inverse pattern of thethird material layer 11. After exposure and development, as well as apossible cleaning to remove any residual polymers left in the openings,the third material layer 11 is deposited. Subsequently, the photoresistis lifted-off, thereby removing the unwanted material that is depositedon the resist and leaving behind the patterned third material layer 11,where it was deposited directly onto the underlying substrate surface(i.e., in places where the resist was absent) as shown in FIG. 4 (e).

Next, another lithography is performed to define the patterns for theetch process of the third predefined shapes and dimensions to form thepillars or posts 15 of the field emitter device 10 or 20. As before, thedimensional resolution of the lithography must be able to createsub-micron features with sub-micron registration accuracy for eachlayer. The lithography can be performed by several means including, butnot limited to e-beam direct write lithography, interferencelithography, or Deep Ultra-Violet (Deep UV or DUV) optical lithography.The photoresist is exposed and developed so as to form a photoresistmask where the pillars or posts are to be located. Using thislithography, either single pillar or post patterns or arrays of pillarsor posts (FIG. 1 or 2) can be implemented depending on the application.Additionally, the dimensions of the pillars or posts may be chosen tobias these dimensions to compensate for lateral etch during the pillaror post etch, depending on the etch technology used to fabricate thepillars or posts. In general, the diameter of the resist will be equal,to or slightly larger than, the diameter of the second material layer12.

After this lithography step has been completed, the exposed regions ofthe substrate are etched to form the high aspect ratio pillar or poststructures, as shown in FIGS. 4 (f 1) and 4 (f 2). The depth of the etchwill determine the height of the pillar or post from the substrate floorand have a significant impact on the behavior and operation of the fieldemitted device 10 or 20. The etching into the surface of the firstmaterial substrate 16 can be performed using Reactive Ion Etching (RIE)or Deep Reactive Ion Etching (DRIE) or even by wet chemical etching,with DRIE being preferred. This etch is difficult due to the extremeloading effects (i.e., the area of the substrate that is exposed andbeing etched) involved that may depending on the field emitter device 10or 20 design approach a loading effect of nearly 100%. The preferredrecipe using DRIE to form the pillars or posts is a continuous etchrecipe with O2, C4F8, and SF6 gasses. The etch recipe will need to matchto undercut requirements (lateral etch underneath the mask) for a givendesign. The undercut amount is mainly controlled by O2 flow. The O2 flowis typically between 30-100 sccm, where as C4F8 and SF6 flow rates are5-20 sccm, and 75 sccm, respectively. Coil and platen powers are 800W-2000 W and 10 W-40 W, respectively.

Depending on the selectivity of the first material substrate etch to thephotoresist mask and the desired height of the pillars or posts, it maybe desirable to form a hard mask layer for the pillar or post etch. Thatis, a hard mask that is composed of a material layer type that is moreresistant to the pillar or post etch may be used in conjunction with, oras a replacement for the photoresist mask. A preferred embodiment forthe hard mask is to deposit a thin layer of alumina (Al2O3) directly onthe surface of substrate, including the regions with the patterned andetched second and third layer materials, and then perform lithography onthis layer, whereby the alumina is left as a hard mask where the pillarsor posts are to be defined. The etching of the exposed alumina can bedone using immersion in photoresist developer solution. Once the pillaror post etch is complete, the alumina is removed by stripping anyresidual photoresist left on the hard mask and then immersing thesubstrate in photoresist developer solution sufficiently long that it iscompletely removed. The use of the hard mask material for the pillar orpost etch allows the height of these structures to be made 30 microns ormore, or even a few hundred microns if desired, depending on thethickness of the hard mask and the exact selectivity of the etch processused.

The third material layer 11 may be heated to a temperature to a pointwhere the material softens or even melts, whereupon the surface tensioneffects of the third material layer 11 on the surface of the secondmaterial 12 can coalesce into an approximately hemi-spherical shape of adroplet and a diameter less than the original dimensions of this layer11, as shown in FIG. 4 (g). This may be preferable for preparing thethird material layer 11 for the growth of the carbon nanotubes 18.

Subsequently, the carbon nanaotubes 18 are grown on the areas of thepillars or posts where the catalyst is located using any of the methodsused for carbon nanotube growth, such as Chemical Vapor Deposition (CVD)as shown in FIG. 4 (h).

As discussed above, it may be desirable for certain applications tofabricate the field emission devices without the carbon nanotubeemitters grown at the top of the emitters, as shown in FIGS. 1 and 2,thereby resulting in the configuration of field emitter that isillustrated in FIG. 3. As can be seen from FIGS. 1 and 3, except for theabsence of the carbon nanotubes 18 in FIG. 3, the implementation of thefield emission device 10 shown in FIG. 3 is similar to theimplementation of the field emission device shown in FIG. 1. In thisregard, as stated above, the preferred method for fabrication of thefield emission device 10, also known as the process sequence for thedevice 10, is illustrated in FIG. 4, which process sequence has severalpreferred variations, each of which begins with a highly electricallyconductive substrate made of a first material 16, as shown in FIG. 4(a). Thus, to make an electron field emission device without the carbonnanotubes, first, a suitable first material substrate 16 that iselectrically conductive is again selected, as shown in FIG. 4(a). Next,again, a thin-film layer of second material layer 12 that iselectrically conductive is deposited onto the first material substrate16, as shown in FIG. 4(b). Patterning and etching the second materiallayer 12 into a second predefined shape and dimensions is againperformed, as shown in FIG. 4(b 1). Finally, patterning and performingan etching into the first material substrate 16 to a predefined depth toform a pillar or post shape structure 15 to a predefined height is shownin FIG. 4(f 2) is also again performed. However, unlike the fieldemission device shown in FIG. 1, carbon nanotubes 18 are not grown onthe areas of the pillars or posts 15.

Depending on the application, it may be desirable to separate thesubstrate into individual dies. This may be difficult, given thefragility of the pillar or posts structures, and as such, specialprocessing techniques need to be used. One method of die separation isto deposit a very thick layer of photoresist or polymer 32 onto thesubstrate 16 prior to die separation, as shown in FIG. 5. The thicknessof the photoresist or polymer 32 may have a thickness equal to orgreater than the height of the pillar or posts structures on thesubstrate. Subsequently, the substrate is then placed onto a diesaw andthe diced into a plurality of individual die. Next, the photoresist orpolymer layer is removed using appropriate means of which a wet chemicalimmersion in a polymer stripping agent would be preferred.

Another method of die separation is to etch into the substrate asufficient depth so as to form cleaving trenches 33 in substrate 16, asshown in FIG. 6. The preferred method of etching these cleaving trenches33 is DRIE, although other means of deep etching can be used, dependingon the size of the die and the type of first material substrate 16 beingused. Preferably, the cleaving trench 33 etch is performed on thebackside of the substrate 16 and before the pillar or post etch has beenperformed. Once the fabrication of the device substrate is complete, thedie can be separated from the substrate using a cleaving operation

Yet another method of die separation is to take a separate substrate 34,perform lithography on that substrate 34, thereby exposing areas of thesubstrate, and then performing an etch into the substrate to form cavity35 having a depth greater than the height of the pillar or posts 15 onthe device substrate 16, as shown in FIG. 7. Subsequently, an adhesive,such as thermal tape 36 with adhesive on both sides is placed onto thesubstrate 34 with cavity 35 etched into its surface, as shown in FIG. 7(a). The tape 36 may be patterned before or after it is placed onto thesubstrate surface 34. Next, the device substrate 16 with the pillars orposts 15 is bonded to the cavity substrate 34, thereby forming anenclosure for the individual pillars or posts 15, which will protectsuch pillars or posts 15 from damage as shown in FIG. 7 (b). The bondedcomposite substrates are then diced using a diesaw into individual dies.Since the locations of the dicing lines are not visible in the bondedcomposite substrate, it may be necessary to form alignment marks on thebackside of the cavity or device substrate prior to them being bonded toone another. After dicing, the cavity die are removed from the devicedie, thereby exposing the pillar or post 15 device structures as shownin FIG. 7 (c).

Yet another method of die separation is to use a laser machine tool tocut the substrate into individual die. It may be necessary to place aprotective coating, such as a photoresist or polymer layer, on thesubstrate surface prior to the laser dicing operation in order toprotect the surface from re-deposited material. If a protective coatingis used, the substrate will then be cleaned using an appropriate meansof removing this protective coating material such as a solventimmersion.

Regardless of the die separation technique used, it is understood thatdie separation is preferably performed prior to the growth of the carbonnanotubes on the pillar or post structures.

While the invention has been described in connection with what ispresently considered to be the most practical and preferred embodiments,it is to be understood that the invention is not to be limited to thedisclosed embodiments, but on the contrary, is intended to cover variousmodifications and equivalent arrangements included within the spirit andscope of the appended claims.

What is claimed is:
 1. A method of fabricating an electron fieldemission device using micro- and nano-fabrication techniques, the methodcomprising: selecting a first material substrate that is electricallyconductive, depositing onto the first material substrate a secondmaterial layer that is electrically conductive, patterning and etchingsaid second material layer into a first predefined shape and dimensions,depositing onto a surface of the patterned second material layer a thirdmaterial layer that is electrically conductive, patterning and etchingsaid third material layer into a second predefined shape and dimensions,defining a pattern for an etch of a third predefined shape and dimensioninto the first material substrate, performing an etch of the thirdpredefined shape into the first material substrate to a predefined depthto form a pillar or post, heating the first material substrate to apredefined temperature whereby the third material layer re-forms into apredefined shape suitable for carbon nanotube growth, and growing atleast one carbon nanotube on the third material layer to a predefinedheight.
 2. The method of claim 1, wherein the third material layer is acatalyst for carbon nano-tube growth.
 3. The method of claim 1, whereinthe first material substrate is composed of a semiconductor or metalmaterial type.
 4. The method of claim 1, wherein the first materialsubstrate is silicon.
 5. The method of claim 1, wherein the secondmaterial layer is Titanium Nitride (TiN).
 6. The method of claim 1,wherein the third material layer is Nickel or Iron.
 7. The method ofclaim 1, wherein the third material layer is etched to the secondpredefined shape and dimensions using ion milling, reactive ion etching,or wet etching technology.
 8. The method of claim 1, wherein the secondmaterial layer is etched to the second predefined shape and dimensionsusing ion milling, reactive ion etching, or wet etching technology. 9.The method of claim 1, wherein the third material layer is etched to thethird predefined shape and dimensions using ion milling and redepositedmaterial of the third material layer resulting from the ion milling isremoved using oblique angle ion milling for a short period of time. 10.The method of claim 1, wherein the second material layer is etched tothe second predefined shape and dimensions using ion milling andredeposited material of the second material layer resulting from the ionmilling is removed using oblique angle ion milling for a short period oftime.
 11. The method of claim 1, wherein alignment marks are made in thefirst material substrate to accurately register the first materialsubstrate and the second and/or third material layers of the fieldemitter device.
 12. The method of claim 11, wherein the alignment marksare patterned and etched in the surface of the first material substrateprior to deposition of the second material layer.
 13. The method ofclaim 11, wherein a fourth material layer is deposited onto the firstmaterial substrate prior to deposition of the second material layer andsaid fourth material layer is patterned and etched to define alignmentmarks for the alignment of subsequent layers, which are then patternedand etched in the surface of the first material substrate prior todeposition of the second material layer.
 14. The method of claim 13,wherein the fourth material layer is composed of thin film materiallayer types consisting of dielectrics; metals; and polymers.
 15. Themethod of claim 1, wherein thickness of the third material layer isbetween 7 and 10 nanometers.
 16. The method of claim 1, whereinthickness of the third material layer is less than 7 nanometers.
 17. Themethod of claim 1, wherein thickness of the third material layer is morethan 10 nanometers.
 18. The method of claim 1, wherein thickness of thesecond material layer is approximately 50 nanometers.
 19. The method ofclaim 1, wherein thickness of the second material layer is less than 10nanometers.
 20. The method of claim 1, wherein thickness of the secondmaterial layer is between 10 and 100 nanometers.
 21. The method of claim1, wherein thickness of the second material layer is more than 100nanometers.
 22. The method of claim 1, wherein diameter of the thirdmaterial layer is 100 and 150 nanometers.
 23. The method of claim 1,wherein diameter of the third material layer is less than 100nanometers.
 24. The method of claim 1, wherein diameter of the thirdmaterial layer is more than 150 nanometers.
 25. The method of claim 1,wherein diameter of the second material layer is between 300 and 500nanometers.
 26. The method of claim 1, wherein diameter of the secondmaterial layer is less than 300 nanometers.
 27. The method of claim 1,wherein diameter of the second material layer is more than 500nanometers.
 28. The method of claim 1, wherein the pattern employs asingle pillar or post for each field emission device.
 29. The method ofclaim 1, wherein the pattern employs an array of pillars or posts foreach field emission device.
 30. The method of claim 1, wherein the etchused to form the pillar or post results in a height of the said pillaror post of 10 microns.
 31. The method of claim 1, wherein the etch usedto form the pillar or post results in a height of the said pillar orpost of between 10 microns and 30 microns.
 32. The method of claim 1,wherein the etch used to form the pillar or post results in a height ofthe said pillar or post of more than 30 microns.
 33. The method of claim1, wherein the etch used to form the pillar or post is Deep Reactive IonEtching (DRIE).
 34. The method of claim 33, wherein the etch used toform the pillar or post using Deep Reactive Ion Etching (DRIE) with arecipe: composed of 70sccm O2, 7sccm C4F8, 75sccm SF6, RF power of 900W, and platen power of 20W.
 35. The method of claim 1, wherein a hardmask composed of A12O3 is used for the pillar etch.
 36. The method ofclaim 5, wherein the second material layer is deposited usingChemical-Vapor Deposition (CVD) or Physical-Vapor Deposition (PVD)processes, that include reactive PVD processes, or Atomic LayerDeposition (ALD).
 37. The method of claim 36, wherein the secondmaterial layer is deposited using reactive sputtering, sputtering,evaporation, or reactive evaporation.
 38. The method of claim 6, whereinthe third material layer is deposited using Chemical-Vapor Deposition(CVD) or Physical-Vapor Deposition (PVD) processes, that includereactive PVD processes, or Atomic Layer Deposition (ALD).
 39. The methodof claim 38, wherein the third material layer is deposited usingreactive sputtering, sputtering, evaporation, or reactive evaporation.40. The method of claim 4, wherein the said first material substratecomposed of silicon is to 1×10¹⁹ dopants/cm³ make it electricallyconductive.
 41. The method of claim 40, wherein doping level of thesilicon is greater than 1×10¹⁹ dopants/cm³.
 42. The method of claim 38,wherein the second material layer is deposited using a recipe composedof 3 milli-Torr pressure of Ar/N2 at 50 standard cubic centimeters perminute operating at a sputtering power of 2000 Watts and a 350 kHzfrequency with a 1.1 microsecond pulse power duration.
 43. The method ofclaim 1, wherein the second material layer includes Titanium Nitride(TiN) annealed after the second material layer deposition.
 44. Themethod of claim 43, wherein the percentage of Titanium to Nitrogen inthe deposited TiN film layer is approximately 50% to 50%.
 45. The methodof claim 43, wherein the second material layer composed ofTitanium-Nitride has a smooth surface.
 46. The method of claim 43,wherein the second material layer composed of Titanium Nitride isannealed immediately after the second material layer deposition.
 47. Themethod of claim 43, wherein the second material layer composed ofTitanium Nitride is in-situ annealed after the second material layerdeposition.
 48. The method of claim 43, wherein the second materiallayer composed of Titanium Nitride is annealed using rapid thermalanneal (RTA).
 49. The method of claim 48, wherein the second materiallayer composed of Titanium Nitride is annealed using rapid thermalanneal (RTA) with a background non-reactive gas of Nitrogen or Argon andat a temperature of approximately 800° C. for 30 seconds.
 50. The methodof claim 7, wherein the third material layer is etched to predefinedshapes composed of circles.
 51. The method of claim 8, wherein thesecond material layer is etched to predefined shapes composed ofcircles.
 52. The method of claim 1, wherein single-walled carbonnanotubes are grown on a surface of the third material layer.
 53. Themethod of claim 1, wherein multi-walled carbon nanotubes are grown onthe surface of the third material layer.
 54. The method of claim 1,wherein the carbon nanotubes are grown by means of Chemical VaporDeposition (CVD).
 55. The method of claim 1, wherein the substrate isseparated into individual dies by depositing a layer of photoresist orpolymer on the surface of the first material substrate after the pillaretch has been completed and before the carbon nanotube growing has beenperformed, subsequently dicing the substrate into a plurality ofindividual dies, and then removing said polymer using a wet chemicalimmersion.
 56. The method of claim 55, wherein the layer of photoresistor polymer deposited on the surface of the first material substrate hasa thickness sufficient to encase the pillars or posts on the substrate.57. The method of claim 1, wherein the substrate is separated intoindividual dies by etching cleaving trenches into the backside of thefirst material substrate before performing the pillar or post etch,performing the remaining steps of the field emission device fabricationup to a point before the carbon nanotube growing, and then cleaving thesubstrates into a plurality of individual dies.
 58. The method of claim1, wherein the first material substrate is separated into individualdies by etching cavities into a second substrate of a depth greater thanthe height of the pillars or posts fabricated on the surface of thefirst material substrate, placing a double-sided thermal tape onto thesecond substrate that has been etched with said cavities, bonding thesecond and the first material substrate together to enclose the pillarsor posts in a sealed cavity, dicing the substrate into a plurality ofindividual dies and then removing the cavity die from the device diethereby exposing the pillar or post device structures.
 59. The method ofclaim 58, wherein the thermal tape is patterned prior to placing thetape onto the cavity substrate.
 60. The method of claim 58, whereinalignment marks are formed into the backside of the cavity or devicesubstrate prior to the cavity and device substrate being bonded to oneanother, so as to facilitate locating the exact locations of dicinglines prior to performing dicing of the substrate.
 61. The method ofclaim 58, wherein die separation of the first material substrate isperformed using a laser machine tool to cut the substrate into aplurality of individual dies.
 62. The method of claim 61, wherein aprotective coating, of a photoresist or polymer layer is deposited on asurface of the first material substrate prior to laser dicing operationin order to protect the substrate surface from re-deposited material andthen removing said protective coating using a solvent immersion afterthe substrate has been diced into the plurality of individual dies. 63.The method of claim 14, wherein dielectrics include oxides, nitrides oroxy-nitrides.
 64. The method of claim 14, wherein the metals includealuminum or platinum.
 65. The method of claim 14, wherein the polymersinclude photoresist or polyimide.